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Scanning Electron Microscopy of Plastics Failure, by Gottfried Ehrenstein, Lothar Engel, Hermann Klingele, Helmut Schaper
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Scanning electron microscopy (SEM) is often used in plastics failure analysis when light microscopy cannot provide images of high enough resolution. SEM images also provide higher contrast, in particular of surface textures. SEM is also advantageous with very dark surfaces and transparent materials. This book is an unrivaled comprehensive collection of SEM images covering topics such as surface properties, adhesion, joining, fracture, and other types of failure of plastic parts, which are of decisive importance for the economic success of plastics manufacturing operations. Contents: Structure, Properties and Processing of Polymeric Materials. Surface Damage. Fractures.
- Sales Rank: #4435019 in Books
- Published on: 2010-09-01
- Original language: English
- Dimensions: 10.50" h x 8.00" w x .75" l, 2.05 pounds
- Binding: Hardcover
- 267 pages
Most helpful customer reviews
1 of 1 people found the following review helpful.
One of the best books on that issue
By Christian Keintzel
Of course with 200$ it is fairly expensive, but it is one of the best collections of micrographs of plastic failures to compare with, when you are working in the field of failure analysis.
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